JKMS
pISSN 0304-9914
eISSN 2234-3008
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Lee S.
On the goodness of fit test for discretely observed sample from diffusion processes: divergence measure approach
. J. Korean Math. Soc. 2010;47:1137-1146.
https://doi.org/10.4134/JKMS.2010.47.6.1137
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